CALCULATING X-RAY DIFFRACTION FROM MULTILAYER LATERAL CRYSTAL STRUCTURES WITH ARBITRARY SHAPES AND COMPOSITION PROFILES
14 сентября 2018
181
Предметная область | — |
Выходные данные | — |
Ключевые слова | — |
Вид публикации | Статья |
Контактные данные автора публикации | PUNEGOV V., MAKSIMOV A.I., KOLOSOV S.I., PAVLOV K.M. |
Ссылка на публикацию в интернете | www.maik.ru/cgi-perl/search.pl?type=abstract&name=techphlt&number=2&year=7&page=125 |
Аннотация
A theory of x-ray diffraction in the vertical direction from a lateral crystal having an arbitrary shape
and arbitrary depth–composition profile has been developed within the framework of the kinematic approxima-
tion. The results of a numerical simulation of diffraction patterns from such crystals in high-resolution triple-
axis diffractometry scheme are presented.
and arbitrary depth–composition profile has been developed within the framework of the kinematic approxima-
tion. The results of a numerical simulation of diffraction patterns from such crystals in high-resolution triple-
axis diffractometry scheme are presented.
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