Deuterium retention in mixed C-W-D films co-deposited in magnetron discharge in deuterium. Journal of Nuclear Materials Volume 438, Issue 1-3, 2013, Pages 204-208
14 сентября 2018
210
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| Вид публикации | Статья |
| Контактные данные автора публикации | Krat, S. , Gasparyan, Y., Efimov, V., Mednikov, A., Zibrov, M., Pisarev, A. National Research Nuclear University MEPhI |
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Аннотация
Deuterium retention in C-D and C-W-D mixed films deposited in a magnetron discharge in deuterium was studied. The deuterium content in the C-D films was in the range D/C = 0.65-0.75 for grounded substrates and 0.45-0.6 if a bias of -60 V was applied. The deuterium content in the C-W-D films was in the range of D/(C W) = 0.2-0.4 without strong dependence on the C/W ratio (in the range of 0.7-10) and the substrate potential (in the range from 0 to -60 V). Deuterium release from the C-W-D films was observed at lower temperatures than that from the C-D films.© 2013 Elsevier B.V. All rights reserved.
Indexed keywords
Deuterium content; Deuterium retention; Grounded substrates; Lower temperatures; Magnetron discharges; Mixed films; Strong dependences; Substrate potential
ПодробнееIndexed keywords
Deuterium content; Deuterium retention; Grounded substrates; Lower temperatures; Magnetron discharges; Mixed films; Strong dependences; Substrate potential
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