Modeling of functional failures in digital systems under the radiation effect. Automation and Remote Control Volume 74, Issue 4, April 2013, Pages 671-678

14 сентября 2018
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Вид публикации Статья
Контактные данные автора публикации Barbashov, V.M. Moscow Engineering and Physics Institute (MEPhI)
Ссылка на публикацию в интернете AND PU


In this paper we study modeling techniques for functional failures in digital systems under the radiation effect; these techniques are based on Brouwers model of a fuzzy digital automaton. In comparison with common approaches, a fundamental difference of such method lies in the feasibility of explicit consideration (in functional-logical models) of the relationship between radiation resistance of integrated circuits (IC) and their mode of operation, functional state, engineering and schematic parameters. In addition, certain methods for constructing criterion membership functions are proposed for basic elements in different IC. Finally, the algorithms for forecasting transient and residual radiation effects in IC are developed. © 2013 Pleiades Publishing, Ltd.
Indexed keywords
Basic elements; Digital system; Functional failure; Functional state; Mode of operations; Modeling technique; Radiation resistance; Residual radiation
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