Maximum drift velocity of electrons in selectively doped InAlAs/InGaAs/InAlAs heterostructures with InAs inserts. Semiconductors Volume 47, Issue 3, 2013, Pages 372-375

14 сентября 2018
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Контактные данные автора публикации Šilenas, A.a, Požela, Y.a , Požela, K.a, Juciene, V.a, Vasilevskii, I.S.bc, Galiev, G.B.b, Pushkarev, S.S.b, Klimov, E.A.b a Semiconductor Physics Institute, Center for Physical Sciences and Technology, Vilnius, 01108, Li
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Аннотация

The dependence of the electron mobility and drift velocity on the growth conditions, thickness, and doping of an InAs insert placed at the center of the quantum well in a selectively doped InAlAs/InGaAs/InAlAs heterostructure has been investigated. Record enhancement of the maximum drift velocity to (2-4) × 107 cm/s in an electric field of 5 × 103 V/cm has been obtained in a 17-nm-wide quantum well with an undoped 4-nm-thick InAs insert. In the structures with additional doping of the InAs insert, which facilitates an increase in the density of electrons in the quantum well to 4. 0 × 1012 cm-2, the maximum drift velocity is as high as 2 × 107 cm/s in an electric field of 7 × 103 V/cm.
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