Spectrometer for hard X-ray free-electron laser based on diffraction focusing . Journal of Synchrotron Radiation Volume 20, Issue 2, March 2013, Pages 258-265
14 сентября 2018
222
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Вид публикации | Статья |
Контактные данные автора публикации | Kohn, V.G.a, Gorobtsov, O.Y.b, Vartanyants, I.A.bc a National Research Center Kurchatov Institute, Kurchatov Square 1, 123182 Moscow, Russian Federation b Deutsches Electronen-Synchrotron DESY, Notkestrasse 85, D-22607 Hamburg, Germa |
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Аннотация
X-ray free-electron lasers (XFELs) generate sequences of ultra-short spatially coherent pulses of X-ray radiation. A diffraction focusing spectrometer (DFS), which is able to measure the whole energy spectrum of the radiation of a single XFEL pulse with an energy resolution of ΔE/E ≃ 2 × 10-6, is proposed. This is much better than for most modern X-ray spectrometers. Such resolution allows one to resolve the fine spectral structure of the XFEL pulse. The effect of diffraction focusing occurs in a single-crystal plate due to dynamical scattering, and is similar to focusing in a Pendry lens made from a metamaterial with a negative refraction index. Such a spectrometer is easier to operate than those based on bent crystals. It is shown that the DFS can be used in a wide energy range from 5 keV to 20 keV. © 2013 International Union of Crystallography.
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Author keywords
Compound refractive lenses; Diffraction focusing spectrometer; Hard X-ray free-electron laser
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Indexed keywords
Bent crystals; Coherent pulse; Compound refractive lens; Dynamical scattering; Energy resolutions; Energy spectra; Hard X ray; Negative refraction index; Pendry lens; Single-crystal plates; Spectral structure; Wide energy range; X ray radiation; X-ray free electron lasers
Подробнее--------------------------------------------------------------------------------
Author keywords
Compound refractive lenses; Diffraction focusing spectrometer; Hard X-ray free-electron laser
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Indexed keywords
Bent crystals; Coherent pulse; Compound refractive lens; Dynamical scattering; Energy resolutions; Energy spectra; Hard X ray; Negative refraction index; Pendry lens; Single-crystal plates; Spectral structure; Wide energy range; X ray radiation; X-ray free electron lasers
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