Study of SEL and SEU in SRAM using different laser techniques . Proceedings of the European Conference on Radiation and its Effects on Components and Systems, RADECS 28 October 2014, Article number 6937411

14 сентября 2018
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Вид публикации Тематический материал
Контактные данные автора публикации Savchenkov, D.V.a , Chumakov, A.I.b , Petrov, A.G.a , Pechenkin, A.A.a , Egorov, A.N.b , Mavritskiy, O.B.b , Yanenko, A.V.b a Department of Electronics of National Nuclear Research University MEPhI, Moscow, Russian Federation
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Аннотация

Single event upset (SEU) and single event latchup (SEL) laser testing results of SRAM CY62256 using both focused and local laser irradiation techniques are presented. Variable laser wavelength was used for SEU and SEL threshold linear energy transfer (LET) estimation. The backside laser irradiation technique was also applied. Laser testing results were compared to heavy ion testing ones. © 2013 IEEE.



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Author keywords

heavy ion testing; laser technique; SEL; SEU



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Indexed keywords

Engineering controlled terms: Energy transfer; Irradiation; Radiation effects; Radiation hardening
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