Distortion invariant correlation filters application for quality inspection of master-matrix for security holograms. Proceedings of SPIE - The International Society for Optical Engineering. Volume 8748, 2013, Article number 87480P

Оставить комментарий

Предметная область	—
Выходные данные	—
Ключевые слова	—
Вид публикации	Тематический материал
Контактные данные автора публикации	Zlokazov, E.a , Shaulskiy, D.a, Starikov, R.a, Odinokov, S.b, Zherdev, A.b, Koluchkin, V.b, Shvetsov, I.b, Smirnov, A.c a National Research Nuclear Univ. MEPhI, Moscow, Russian Federation b Bauman Moscow State Technical U
Ссылка на публикацию в интернете	www.scopus.com/record/display.url?origin=recordpage&eid=2-s2.0-84881122662&citeCnt=3&noHighlight=false&sort=plf-f&src=s&st1=MEPhI&nlo=&nlr=&nls=&sid=F0743CC1BB1CEC168410A18CB87C48A7.Vdktg6RVtMfaQJ4pNTCQ:6500&sot=b&sdt=b&sl=31&s=AFFIL(MEPhI) AND PU

Аннотация

Security holograms (SH) are perspective for document and product authenticity protection due to difficulties of such a protection mark falsification. Mass production of SH uses widespread technology of hot foil or lavsan paper stamping. The quality of holograms significantly depends on perfection of nickel master-matrix that is used in stamping equipment. We represent the method of automatic quality inspection of nickel master-matrix based on digital processing of its surface relief microphotographs. Proposed processing algorithm is based on combination of image spatial frequency analysis and image matching using distortion invariant correlation filters. The results of our method application for real SH master-matrices inspection are shown in this paper. © 2013 SPIE.

--------------------------------------------------------------------------------

Author keywords

Distortion invariant filters; Fourier analysis; MACH-filter; Pattern recognition; Security hologram

Подробнее

Для того чтобы оставить комментарий необходимо авторизоваться.